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Journal of Inforamtion Science and Engineering, Vol. 16, No. 5, pp. 767-781 (September 2000)

Impulse Response Fault Model and Fault Extraction for Functional Level Analog Circuit Diagnosis

Chauchin Su, Yue-Tsang Chen and Shen-Shung Chiang
Department of Electrical Engineering
National Central University
Chungli, Taiwan 320, R.O.C.

In this paper, a functional fault model for analog circuit diagnosis is proposed. A faulty circuit is modeled as a fault-free module in serial or in parallel with a fault module. To extract the faults, we adopt an iterative deconvolution technique to deconvolute the impulse response of the fault module from the faulty response. Such impulse response fault modeling makes the faults independent of input signals and system function. As the test results show, the input independent property significantly improves the diagnostic resolution, and the system function independent property allows single-module fault tables to be applied to multi-module diagnosis.

Keywords: VLSI test, analog test, fault model, diagnosis, functional test, neural network

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Received June 29, 1999; revised December 23, 1999; accepted March 7, 2000.
Communicated by Cheng-Wen Wu.