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Journal of Information Science and Engineering, Vol. 23 No. 6, pp. 1901-1909 (November 2007)

Test Data Compression for Minimum Test Application Time

Po-Chang Tsai, Sying-Jyan Wang, Ching-Hung Lin and Tung-Hua Yeh
 Department of Computer Science
National Chung-Hsing University
Taichung, 402 Taiwan

In this paper, we proposed a test data compression scheme targeted for minimizing the amount of test data. The proposed scheme can reduce the test application time and minimize the amount of compressed test data, which reduces the size of data memory in ATE and the time needed to transfer test data. A decoder design is also presented. Experimental results on ISCAS benchmark circuits show that the compressed data produced by our method are much smaller than previous methods.

Keywords: test data compression, decompression architecture, SOC, testing, forced bitinversion, intellectual property

Full Text (¥þ¤åÀÉ) Retrieve PDF document (200711_16.pdf)

Received September 30, 2005; revised December 23, 2005 & February 22, 2006; accepted March 16, 2006.
Communicated by Liang-Gee Chen.