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Journal of Information Science and Engineering, Vol.19 No.4, pp.637-651 (July 2003)

Structure-Based Specification-Constrained Test Frequency Generation for Linear analog Circuits

Soon-Jyh Chang, Chung-Len Lee and Jwu E Chen*
Department of Electronic Engineering
and Institute of Electronics
National Chiao Tung University
Hsinchu, 300 Taiwan
*Department of Electrical Engineering
Chung-Hua University
Hsinchu, 300 Taiwan

In this paper, an approach to generating the sinusoidal stimulus of the right frequency of a linear analog circuit for testing circuit parameter faults under the constraints of the specifications of the circuit under test (CUT) is presented. This approach considers tolerance bounds due to fabrication process fluctuations of tested parameters using a statistical model and maps them to an accepted region of the observed signature of the CUT. The generated test stimulus is derived based on a proposed testing confidence level. Test generation procedures for both the monotonic and non-monotonic relationships between the signature and the parameter are proposed and demonstrated. The procedures are applied to a continuous time state-variable filter example circuit to show the effectiveness of the methodology.

Keywords: test pattern generation, analog IC test, structural test, specification test, Monte-Carlo analysis

Full Text () Retrieve PDF document (200307_06.pdf)

Received October 3, 2001; revised April 12 & July 15, 2002; accepted September 4, 2002.
Communicated by Cheng-Wen Wu.